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Applied Optics
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February 16, 2010
Diffraction limitations for plasma electron density measurements with schlieren methods
G Dodel, W Kunz
Applied Optics
|
August 19, 2010
High-speed switching of far-infrared radiation by photoionization in a semiconductor
T Vogel, G Dodel, E Holzhauer, et al.
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of 1
Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Applied Optics
|
February 16, 2010
Diffraction limitations for plasma electron density measurements with schlieren methods
G Dodel, W Kunz
Applied Optics
|
August 19, 2010
High-speed switching of far-infrared radiation by photoionization in a semiconductor
T Vogel, G Dodel, E Holzhauer, et al.
Page
of 1