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Ultramicroscopy
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August 2, 2017
Feedforward neural network methodology to characterize thin films by Electrostatic Force Microscopy
M Konomi, G M Sacha
Nanotechnology
|
October 15, 2013
Artificial intelligence in nanotechnology
G M Sacha, P Varona
The Journal of Physical Chemistry. B
|
July 28, 2006
Induced water condensation and bridge formation by electric fields in atomic force microscopy
G M Sacha, A Verdaguer, M Salmeron
The Journal of Physical Chemistry. B
|
November 1, 2017
A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film
G M Sacha, A Verdaguer, M Salmeron
Nanotechnology
|
May 7, 2009
An inverse problem solution for undetermined electrostatic force microscopy setups using neural networks
G M Sacha, F B Rodríguez, P Varona
Physical Chemistry Chemical Physics : PCCP
|
November 4, 2011
Dipolar origin of water etching of amino acid surfaces
J J Segura, A Verdaguer, G M Sacha, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
March 24, 2012
Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
E Castellano-Hernández, J Moreno-Llorena, J J Sáenz, et al.
The Journal of Chemical Physics
|
January 6, 2006
Initial stages of water adsorption on NaCl (100) studied by scanning polarization force microscopy
Albert Verdaguer, G M Sacha, M Luna, et al.
Nanotechnology
|
June 25, 2009
Influence of the macroscopic shape of the tip on the contrast in scanning polarization force microscopy images
G M Sacha, M Cardellach, J J Segura, et al.
Nanoscale
|
October 18, 2012
Fast and non-invasive conductivity determination by the dielectric response of reduced graphene oxide: an electrostatic force microscopy study
Cristina Gómez-Navarro, Francisco J Guzmán-Vázquez, Julio Gómez-Herrero, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 12) with videos related to
Sort By:
Page
of 2
Ultramicroscopy
|
August 2, 2017
Feedforward neural network methodology to characterize thin films by Electrostatic Force Microscopy
M Konomi, G M Sacha
Nanotechnology
|
October 15, 2013
Artificial intelligence in nanotechnology
G M Sacha, P Varona
The Journal of Physical Chemistry. B
|
July 28, 2006
Induced water condensation and bridge formation by electric fields in atomic force microscopy
G M Sacha, A Verdaguer, M Salmeron
The Journal of Physical Chemistry. B
|
November 1, 2017
A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film
G M Sacha, A Verdaguer, M Salmeron
Nanotechnology
|
May 7, 2009
An inverse problem solution for undetermined electrostatic force microscopy setups using neural networks
G M Sacha, F B Rodríguez, P Varona
Physical Chemistry Chemical Physics : PCCP
|
November 4, 2011
Dipolar origin of water etching of amino acid surfaces
J J Segura, A Verdaguer, G M Sacha, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal
|
March 24, 2012
Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy
E Castellano-Hernández, J Moreno-Llorena, J J Sáenz, et al.
The Journal of Chemical Physics
|
January 6, 2006
Initial stages of water adsorption on NaCl (100) studied by scanning polarization force microscopy
Albert Verdaguer, G M Sacha, M Luna, et al.
Nanotechnology
|
June 25, 2009
Influence of the macroscopic shape of the tip on the contrast in scanning polarization force microscopy images
G M Sacha, M Cardellach, J J Segura, et al.
Nanoscale
|
October 18, 2012
Fast and non-invasive conductivity determination by the dielectric response of reduced graphene oxide: an electrostatic force microscopy study
Cristina Gómez-Navarro, Francisco J Guzmán-Vázquez, Julio Gómez-Herrero, et al.
Page
of 2