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Methodsx|October 13, 2018
Guidelines for establishing an etching procedure for dislocation density measurements on multicrystalline silicon samplesKrzysztof Adamczyk, Gaute Stokkan, Marisa Di SabatinoJournal of Mass Spectrometry : JMS|July 12, 2021
Application of 7N In as secondary cathode for the direct current-glow discharge mass spectrometry analysis of solid, fused high-purity quartzJochen Busam, Gaute Stokkan, Astrid Marie F Muggerud, et al.Methodsx|March 27, 2023
Novel combinatory method for surface and crystallinity analysis of crystalline materials: Combinatory analysis method for crystalline materials surfaceVladyslav Matkivskyi, Arne Karstein Røyset, Gaute Stokkan, et al.Pageof 1