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IEEE Transactions on Pattern Analysis and Machine Intelligence|July 12, 2018
Deep Metric Learning with BIER: Boosting Independent Embeddings RobustlyMichael Opitz, Georg Waltner, Horst Possegger, et al.Waste Management & Research : the Journal of the International Solid Wastes and Public Cleansing Association, ISWA|June 24, 2024
Image capturing, segmentation and data analysis of shredded refuse streamsHeimo Gursch, Elke Schlager, Franz Thaler, et al.Pageof 1