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Pure and Applied Chemistry. Chimie Pure Et Appliquee|August 25, 2020
Recent advances in analysis of trace elements in environmental samples by X-ray based techniques (IUPAC Technical Report)Roberto Terzano, Melissa A Denecke, Gerald Falkenberg, et al.Metallomics : Integrated Biometal Science|September 13, 2022
Synchrotron XFM tomography for elucidating metals and metalloids in hyperaccumulator plantsKathryn M Spiers, Dennis Brueckner, Jan Garrevoet, et al.Environmental Science & Technology|July 22, 2006
Microprobe techniques for speciation analysis and geochemical characterization of mine environments: the mercury district of Almadén in SpainAnna Bernaus, Xavier Gaona, José Maria Esbrí, et al.Membranes|June 25, 2026
Understanding Vanadium Ion Diffusion in Nafion Using an Atomistic Study and Microscopic Concentration ProfilesSven Hampel, Christian Lutz, Gerald Falkenberg, et al.Journal of Hazardous Materials|October 2, 2022
Sublethal and lethal Cd toxicity in soybean roots specifically affects the metabolome, Cd binding to proteins and cellular distribution of CdElisa Andresen, Isvett Josefina Flores-Sanchez, Dennis Brückner, et al.Analytical Chemistry|November 16, 2006
In vivo investigation of the distribution and the local speciation of selenium in Allium cepa L. by means of microscopic X-ray absorption near-edge structure spectroscopy and confocal microscopic X-ray fluorescence analysisEwa Bulska, Irena A Wysocka, Ma Lstrok Gorzata H Wierzbicka, et al.Journal of Visualized Experiments : Jove|September 10, 2019
X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar CellsChristina Ossig, Tara Nietzold, Bradley West, et al.Journal of Synchrotron Radiation|November 5, 2021
Determination of the through-plane profile of vanadium species in hydrated Nafion studied with micro X-ray absorption near-edge structure spectroscopy - proof of conceptChristian Lutz, Sven Hampel, Sabine Beuermann, et al.Environmental Science & Technology|November 1, 2007
Assessing the origin and fate of Cr, Ni, Cu, Zn, Pb, and V in industrial polluted soil by combined microspectroscopic techniques and bulk extraction methodsRoberto Terzano, Matteo Spagnuolo, Bart Vekemans, et al.Analytical Chemistry|November 13, 2004
Three-dimensional trace element analysis by confocal X-ray microfluorescence imagingLaszlo Vincze, Bart Vekemans, Frank E Brenker, et al.Pageof 8