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Micron (Oxford, England : 1993)|August 5, 2003
EELS performance measurements on a new high energy resolution imaging filterGerald Kothleitner, Ferdinand HoferUltramicroscopy|July 23, 2003
Elemental occurrence maps: a starting point for quantitative EELS spectrum image processingGerald Kothleitner, Ferdinand HoferAnalytical and Bioanalytical Chemistry|September 18, 2007
Application of high-resolution EFTEM SI in an AEMBernhard Schaffer, Werner Grogger, Gerald Kothleitner, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2014
Linking TEM analytical spectroscopies for an assumptionless compositional analysisGerald Kothleitner, Werner Grogger, Martina Dienstleder, et al.Nanotechnology|April 11, 2013
Chemical tuning of PtC nanostructures fabricated via focused electron beam induced depositionHarald Plank, Thomas Haber, Christian Gspan, et al.Micron (Oxford, England : 1993)|January 5, 2005
Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopyKoji Kimoto, Gerald Kothleitner, Werner Grogger, et al.Ultramicroscopy|October 7, 2025
Workflows for multimodal electron tomography using EELS and EDX and their application to a spinodally decomposed CuNiFe alloyTatiana Kormilina, Georg Haberfehlner, Thomas Mairhofer Radlinger, et al.Ultramicroscopy|March 30, 2017
Transformation dynamics of Ni clusters into NiO rings under electron beam irradiationDaniel Knez, Philipp Thaler, Alexander Volk, et al.Micron (Oxford, England : 1993)|November 17, 2020
Benefits of direct electron detection and PCA for EELS investigation of organic photovoltaics materialsGeorg Haberfehlner, Sebastian F Hoefler, Thomas Rath, et al.Ultramicroscopy|December 20, 2016
Transformation dynamics of Ni clusters into NiO rings under electron beam irradiationDaniel Knez, Philipp Thaler, Alexander Volk, et al.Pageof 11