Gilbert A Chahine - JoVE Visualize

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Journal of Synchrotron Radiation|April 1, 2025

Structural dependency of polymer dynamics by means of small-angle X-ray photon correlation spectroscopy and wide-angle X-ray scattering on the D2AM beamlineGrégory Stoclet, Duncan Schwaller, Romain Garlet, et al.

Journal of Applied Crystallography|December 4, 2024

Improving the reliability of small- and wide-angle X-ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotationThomas Perrin, Gilbert A Chahine, Stéphan Arnaud, et al.

Angewandte Chemie (Weinheim an Der Bergstrasse, Germany)|August 2, 2016

X-ray Excited Optical Fluorescence and Diffraction Imaging of Reactivity and Crystallinity in a Zeolite Crystal: Crystallography and Molecular Spectroscopy in OneZoran Ristanović, Jan P Hofmann, Marie-Ingrid Richard, et al.

Angewandte Chemie (International Ed. in English)|May 5, 2016

X-ray Excited Optical Fluorescence and Diffraction Imaging of Reactivity and Crystallinity in a Zeolite Crystal: Crystallography and Molecular Spectroscopy in OneZoran Ristanović, Jan P Hofmann, Marie-Ingrid Richard, et al.

ACS Applied Materials & Interfaces|November 7, 2015

Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X-ray NanodiffractionMarie-Ingrid Richard, Marvin H Zoellner, Gilbert A Chahine, et al.

Journal of Applied Crystallography|February 13, 2020

Real- and Q-space travelling: multi-dimensional distribution maps of crystal-lattice strain (∊044) and tilt of suspended monolithic silicon nanowire structuresSimone Dolabella, Ruggero Frison, Gilbert A Chahine, et al.

Ultramicroscopy|July 27, 2016

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopyNorbert Schäfer, Angus J Wilkinson, Thomas Schmid, et al.

Nature Materials|January 5, 2021

Metal-ferroelectric supercrystals with periodically curved metallic layersMarios Hadjimichael, Yaqi Li, Edoardo Zatterin, et al.

ACS Applied Materials & Interfaces|April 15, 2015

Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction MicroscopyMarvin H Zoellner, Marie-Ingrid Richard, Gilbert A Chahine, et al.

Nanoscale|December 12, 2018

In situ structural evolution of single particle model catalysts under ambient pressure reaction conditionsSara Fernández, Lu Gao, Jan Philipp Hofmann, et al.

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Journal of Synchrotron Radiation|April 1, 2025

Structural dependency of polymer dynamics by means of small-angle X-ray photon correlation spectroscopy and wide-angle X-ray scattering on the D2AM beamlineGrégory Stoclet, Duncan Schwaller, Romain Garlet, et al.

Journal of Applied Crystallography|December 4, 2024

Improving the reliability of small- and wide-angle X-ray scattering measurements of anisotropic precipitates in metallic alloys using sample rotationThomas Perrin, Gilbert A Chahine, Stéphan Arnaud, et al.

Angewandte Chemie (Weinheim an Der Bergstrasse, Germany)|August 2, 2016

X-ray Excited Optical Fluorescence and Diffraction Imaging of Reactivity and Crystallinity in a Zeolite Crystal: Crystallography and Molecular Spectroscopy in OneZoran Ristanović, Jan P Hofmann, Marie-Ingrid Richard, et al.

Angewandte Chemie (International Ed. in English)|May 5, 2016

X-ray Excited Optical Fluorescence and Diffraction Imaging of Reactivity and Crystallinity in a Zeolite Crystal: Crystallography and Molecular Spectroscopy in OneZoran Ristanović, Jan P Hofmann, Marie-Ingrid Richard, et al.

ACS Applied Materials & Interfaces|November 7, 2015

Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X-ray NanodiffractionMarie-Ingrid Richard, Marvin H Zoellner, Gilbert A Chahine, et al.

Journal of Applied Crystallography|February 13, 2020

Real- and Q-space travelling: multi-dimensional distribution maps of crystal-lattice strain (∊044) and tilt of suspended monolithic silicon nanowire structuresSimone Dolabella, Ruggero Frison, Gilbert A Chahine, et al.

Ultramicroscopy|July 27, 2016

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopyNorbert Schäfer, Angus J Wilkinson, Thomas Schmid, et al.

Nature Materials|January 5, 2021

Metal-ferroelectric supercrystals with periodically curved metallic layersMarios Hadjimichael, Yaqi Li, Edoardo Zatterin, et al.

ACS Applied Materials & Interfaces|April 15, 2015

Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction MicroscopyMarvin H Zoellner, Marie-Ingrid Richard, Gilbert A Chahine, et al.

Nanoscale|December 12, 2018

In situ structural evolution of single particle model catalysts under ambient pressure reaction conditionsSara Fernández, Lu Gao, Jan Philipp Hofmann, et al.

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