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Applied Optics
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February 19, 2005
Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafers
Glen D Gillen, Shekhar Guha
Applied Optics
|
April 13, 2004
Refractive-index measurements of zinc germanium diphosphide at 300 and 77 K by use of a modified Michelson interferometer
Glen D Gillen, Shekhar Guha
Optics Express
|
February 4, 2009
Application of Hertz vector diffraction theory to the diffraction of focused Gaussian beams and calculations of focal parameters
Glen D Gillen, Kendra Baughman, Shekhar Guha
Optics Express
|
April 15, 2010
Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theory
Glen D Gillen, Christopher M Seck, Shekhar Guha
Applied Optics
|
January 12, 2008
Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb
Glen D Gillen, Chris Dirocco, Peter Powers, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Applied Optics
|
February 19, 2005
Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafers
Glen D Gillen, Shekhar Guha
Applied Optics
|
April 13, 2004
Refractive-index measurements of zinc germanium diphosphide at 300 and 77 K by use of a modified Michelson interferometer
Glen D Gillen, Shekhar Guha
Optics Express
|
February 4, 2009
Application of Hertz vector diffraction theory to the diffraction of focused Gaussian beams and calculations of focal parameters
Glen D Gillen, Kendra Baughman, Shekhar Guha
Optics Express
|
April 15, 2010
Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theory
Glen D Gillen, Christopher M Seck, Shekhar Guha
Applied Optics
|
January 12, 2008
Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb
Glen D Gillen, Chris Dirocco, Peter Powers, et al.
Page
of 1