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Glen D Gillen

Showing results (1-10 of 5) with videos related to

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Applied Optics|February 19, 2005
Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafersGlen D Gillen, Shekhar Guha
Applied Optics|April 13, 2004
Refractive-index measurements of zinc germanium diphosphide at 300 and 77 K by use of a modified Michelson interferometerGlen D Gillen, Shekhar Guha
Optics Express|February 4, 2009
Application of Hertz vector diffraction theory to the diffraction of focused Gaussian beams and calculations of focal parametersGlen D Gillen, Kendra Baughman, Shekhar Guha
Optics Express|April 15, 2010
Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theoryGlen D Gillen, Christopher M Seck, Shekhar Guha
Applied Optics|January 12, 2008
Temperature-dependent refractive index measurements of wafer-shaped InAs and InSbGlen D Gillen, Chris Dirocco, Peter Powers, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Applied Optics|February 19, 2005
Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafersGlen D Gillen, Shekhar Guha
Applied Optics|April 13, 2004
Refractive-index measurements of zinc germanium diphosphide at 300 and 77 K by use of a modified Michelson interferometerGlen D Gillen, Shekhar Guha
Optics Express|February 4, 2009
Application of Hertz vector diffraction theory to the diffraction of focused Gaussian beams and calculations of focal parametersGlen D Gillen, Kendra Baughman, Shekhar Guha
Optics Express|April 15, 2010
Analytical beam propagation model for clipped focused-Gaussian beams using vector diffraction theoryGlen D Gillen, Christopher M Seck, Shekhar Guha
Applied Optics|January 12, 2008
Temperature-dependent refractive index measurements of wafer-shaped InAs and InSbGlen D Gillen, Chris Dirocco, Peter Powers, et al.
Pageof 1