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Ultramicroscopy|March 31, 2000
Piezoresistive sensors for scanning probe microscopyGotszalk, Grabiec, RangelowUltramicroscopy|June 13, 2003
Calibration and examination of piezoresistive Wheatstone bridge cantilevers for scanning probe microscopyTeodor Gotszalk, Piotr Grabiec, Ivo W RangelowUltramicroscopy|September 27, 2017
Contact atomic force microscopy using piezoresistive cantilevers in load force modulation modeP Biczysko, A Dzierka, G Jóźwiak, et al.Ultramicroscopy|June 13, 2003
Quantum size aspects of the piezoresistive effect in ultra thin piezoresistorsTzv Ivanov, T Gotszalk, T Sulzbach, et al.Sensors (Basel, Switzerland)|October 17, 2019
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam ProcessingPiotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, et al.Micron (Oxford, England : 1993)|February 26, 2016
Metrology of electromagnetic static actuation of MEMS microbridge using atomic force microscopyM Moczała, W Majstrzyk, A Sierakowski, et al.Materials (Basel, Switzerland)|October 16, 2025
Wear Measurements in Cylindrical Telescopic Crowns Using an Active Piezoresistive Cantilever with an Integrated Gold Microsphere ProbeTomasz Dąbrowa, Dominik Badura, Bartosz Pruchnik, et al.The Review of Scientific Instruments|November 4, 2011
Expanded beam deflection method for simultaneous measurement of displacement and vibrations of multiple microcantileversK Nieradka, G Małozięć, D Kopiec, et al.The Review of Scientific Instruments|December 3, 2008
Experimental setup for characterization of self-actuated microcantilevers with piezoresistive readout for chemical recognition of volatile substancesDenis Filenko, Tzvetan Ivanov, Burkhard E Volland, et al.Micron (Oxford, England : 1993)|September 19, 2015
Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopyGrzegorz Wielgoszewski, Piotr Pałetko, Daniel Tomaszewski, et al.Pageof 33