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Nano Letters|June 30, 2021
Advanced Scanning Probe Nanolithography Using GaN NanowiresMahmoud Behzadirad, Stephan Mecholdt, John N Randall, et al.
Micron (Oxford, England : 1993)|February 2, 2023
Ion microsource integrated with scanning electron microscope for sample preparationW Slówko, T Gotszalk
Ultramicroscopy|March 18, 2023
Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopyEwelina Gacka, Piotr Kunicki, Paulina Łysik, et al.
Journal of Research of the National Institute of Standards and Technology|August 26, 2021
Fabrication Process for an Optomechanical Transducer Platform with Integrated ActuationThomas Michels, Ivo W Rangelow, Vladimir Aksyuk
Ultramicroscopy|March 31, 2000
Whisker probesGivargizov, Stepanova, Obolenskaya, et al.
The Review of Scientific Instruments|November 3, 2014
Adaptive AFM scan speed control for high aspect ratio fast structure trackingAhmad Ahmad, Andreas Schuh, Ivo W Rangelow
Ultramicroscopy|April 1, 2014
Investigation of multi-junction solar cells using electrostatic force microscopy methodsM Moczała, N Sosa, A Topol, et al.
Ultramicroscopy|June 26, 2012
Regularization mechanism in blind tip reconstruction procedureG Jóźwiak, A Henrykowski, A Masalska, et al.
Ginekologia Polska|December 17, 2003
[Assessment of the midwives preparation to take care of patients with cervical cancer]Marek Grabiec, Izabela Hellwig
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