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Ultramicroscopy|August 13, 2018
Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images' qualityDaniel Kopiec, Grzegorz Jóźwiak, Magdalena Moczała, et al.
Ultramicroscopy|April 24, 2010
Tunneling/shear force microscopy using piezoelectric tuning forks for characterization of topography and local electric surface propertiesMirosław Woszczyna, Paweł Zawierucha, Agata Masalska, et al.
Sensors (Basel, Switzerland)|October 17, 2019
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam ProcessingPiotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, et al.
Nanotechnology|December 8, 2023
Electrical, thermal and noise properties of platinum-carbon free-standing nanowires designed as nanoscale resistive thermal devicesTomasz Piasecki, Krzysztof Kwoka, Ewelina Gacka, et al.
Nanotechnology|June 30, 2020
Near-zero contact force atomic force microscopy investigations using active electromagnetic cantileversB Świadkowski, W Majstrzyk, P Kunicki, et al.
Ultramicroscopy|December 15, 2020
Active calibration reference of minimized height for characterization of scanning thermal microscopy systemsPaweł Janus, Dariusz Szmigiel, Andrzej Sierakowski, et al.
The Review of Scientific Instruments|June 2, 2014
Atmospheric pressure plasma jet with high-voltage power supply based on piezoelectric transformerMichał Babij, Zbigniew W Kowalski, Karol Nitsch, et al.
Micron (Oxford, England : 1993)|August 1, 2014
Investigation of thermal effects in through-silicon vias using scanning thermal microscopyGrzegorz Wielgoszewski, Grzegorz Jóźwiak, Michał Babij, et al.
Plos One|August 30, 2014
Dielectric barrier discharge ionization in characterization of organic compounds separated on thin-layer chromatography platesMichał Cegłowski, Marek Smoluch, Michał Babij, et al.
Scientific Reports|January 10, 2023
Microcantilever-based current balance for precise measurement of the photon forceBartosz Pruchnik, Karolina Orłowska, Bartosz Świadkowski, et al.
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