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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 3, 2012
Electron tomography of HEK293T cells using scanning electron microscope-based scanning transmission electron microscopyYun-Wen You, Hsun-Yun Chang, Hua-Yang Liao, et al.Analytica Chimica Acta|February 7, 2012
Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60(+)-Ar(+) co-sputteringChi-Jen Chang, Hsun-Yun Chang, Yun-Wen You, et al.Journal of Colloid and Interface Science|July 6, 2012
Adsorption behavior of plasmid DNA on binary self-assembled monolayers modified gold substratesWei-Lun Kao, Hsun-Yun Chang, Guo-Ji Yen, et al.Rapid Communications in Mass Spectrometry : RCM|September 14, 2011
Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60+ and Ar+Yun-Wen You, Hsun-Yun Chang, Wei-Chun Lin, et al.The Analyst|December 15, 2010
The role of the auxiliary atomic ion beam in C60(+)-Ar+ co-sputteringWei-Chun Lin, Chi-Ping Liu, Che-Hung Kuo, et al.ACS Nano|January 27, 2010
Effect of fabrication parameters on three-dimensional nanostructures of bulk heterojunctions imaged by high-resolution scanning ToF-SIMSBang-Ying Yu, Wei-Chun Lin, Wei-Ben Wang, et al.Physical Chemistry Chemical Physics : PCCP|January 25, 2011
Effect of the chemical composition on the work function of gold substrates modified by binary self-assembled monolayersSzu-Hsian Lee, Wei-Chun Lin, Chi-Jen Chang, et al.The Analyst|October 13, 2010
ToF-SIMS imaging of the nanoscale phase separation in polymeric light emitting diodes: effect of nanostructure on device efficiencyBang-Ying Yu, Che-Hung Kuo, Wei-Ben Wang, et al.Pageof 1