Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

H-J Eisler

Showing results (1-10 of 5) with videos related to

Pageof 1
Sort By:
Physical Review Letters|August 11, 2005
Single quantum dot coupled to a scanning optical antenna: a tunable superemitterJ N Farahani, D W Pohl, H-J Eisler, et al.
Science (New York, N.Y.)|June 11, 2005
Resonant optical antennasP Mühlschlegel, H-J Eisler, O J F Martin, et al.
Optics Express|February 8, 2013
Investigating the influences of the precise manufactured shape of dipole nanoantennas on their optical propertiesC Moosmann, G S Sigurdsson, M D Wissert, et al.
Physical Review Letters|September 13, 2002
Surface-enhanced emission from single semiconductor nanocrystalsK T Shimizu, W K Woo, B R Fisher, et al.
The Review of Scientific Instruments|February 6, 2008
A simple method for producing flattened atomic force microscopy tipsP Biagioni, J N Farahani, P Mühlschlegel, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Physical Review Letters|August 11, 2005
Single quantum dot coupled to a scanning optical antenna: a tunable superemitterJ N Farahani, D W Pohl, H-J Eisler, et al.
Science (New York, N.Y.)|June 11, 2005
Resonant optical antennasP Mühlschlegel, H-J Eisler, O J F Martin, et al.
Optics Express|February 8, 2013
Investigating the influences of the precise manufactured shape of dipole nanoantennas on their optical propertiesC Moosmann, G S Sigurdsson, M D Wissert, et al.
Physical Review Letters|September 13, 2002
Surface-enhanced emission from single semiconductor nanocrystalsK T Shimizu, W K Woo, B R Fisher, et al.
The Review of Scientific Instruments|February 6, 2008
A simple method for producing flattened atomic force microscopy tipsP Biagioni, J N Farahani, P Mühlschlegel, et al.
Pageof 1