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Ultramicroscopy|January 11, 2020
High order aberrations calculations of Wien filters using differential algebra methodsYongfeng Kang, Hangfeng Hu, Jingyi ZhaoMicron (Oxford, England : 1993)|August 31, 2025
The analysis approach for high collection efficiency of secondary electron using Wien filter and in-lens collection system based on differential algebra methodHangfeng Hu, Fu Liu, Jie Li, et al.Ultramicroscopy|March 29, 2026
The third-order aberrations of magnetic sector analyzersMeishan Li, Hongqing Tao, Hangfeng Hu, et al.Micron (Oxford, England : 1993)|January 26, 2024
A calculation approach for current density distribution evolution of secondary electrons using differential algebra methodHangfeng Hu, Meishan Li, Jintao Hu, et al.Ultramicroscopy|March 27, 2026
A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systemsJintao Hu, Yihao Ma, Lei Yue, et al.Pageof 1