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Hans Hilgenkamp

Showing results (11-20 of 17) with videos related to

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Nanoscale|April 3, 2023
Nanoscale temperature sensing of electronic devices with calibrated scanning thermal microscopyTimm Swoboda, Nicolás Wainstein, Sanchit Deshmukh, et al.
Nature Materials|June 20, 2006
Electronically coupled complementary interfaces between perovskite band insulatorsMark Huijben, Guus Rijnders, Dave H A Blank, et al.
Physical Review Letters|January 25, 2020
Electron Trapping Mechanism in LaAlO_{3}/SrTiO_{3} HeterostructuresChunhai Yin, Alexander E M Smink, Inge Leermakers, et al.
Science (New York, N.Y.)|September 12, 2015
Critical behavior at a dynamic vortex insulator-to-metal transitionNicola Poccia, Tatyana I Baturina, Francesco Coneri, et al.
ACS Applied Electronic Materials|October 2, 2023
Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO<sub>2</sub> Resistive Random Access Memories to Address Device VariabilityTimm Swoboda, Xing Gao, Carlos M M Rosário, et al.
Faraday Discussions|January 22, 2019
Valence change ReRAMs (VCM) - Experiments and modelling: general discussionMazakazu Aono, Christoph Baeumer, Philip Bartlett, et al.
Faraday Discussions|January 22, 2019
Electrochemical metallization ReRAMs (ECM) - Experiments and modelling: general discussionElia Ambrosi, Philip Bartlett, Alexandra I Berg, et al.
Pageof 2

Showing results (11-20 of 17) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 17 results.
Nanoscale|April 3, 2023
Nanoscale temperature sensing of electronic devices with calibrated scanning thermal microscopyTimm Swoboda, Nicolás Wainstein, Sanchit Deshmukh, et al.
Nature Materials|June 20, 2006
Electronically coupled complementary interfaces between perovskite band insulatorsMark Huijben, Guus Rijnders, Dave H A Blank, et al.
Physical Review Letters|January 25, 2020
Electron Trapping Mechanism in LaAlO_{3}/SrTiO_{3} HeterostructuresChunhai Yin, Alexander E M Smink, Inge Leermakers, et al.
Science (New York, N.Y.)|September 12, 2015
Critical behavior at a dynamic vortex insulator-to-metal transitionNicola Poccia, Tatyana I Baturina, Francesco Coneri, et al.
ACS Applied Electronic Materials|October 2, 2023
Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO<sub>2</sub> Resistive Random Access Memories to Address Device VariabilityTimm Swoboda, Xing Gao, Carlos M M Rosário, et al.
Faraday Discussions|January 22, 2019
Valence change ReRAMs (VCM) - Experiments and modelling: general discussionMazakazu Aono, Christoph Baeumer, Philip Bartlett, et al.
Faraday Discussions|January 22, 2019
Electrochemical metallization ReRAMs (ECM) - Experiments and modelling: general discussionElia Ambrosi, Philip Bartlett, Alexandra I Berg, et al.
Pageof 2