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Harald Rose

Showing results (1-10 of 10) with videos related to

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Ultramicroscopy|February 18, 2022
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detectorHarald Rose
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 24, 2010
The contributions of Otto Scherzer (1909-1982) to the development of the electron microscopeMichael Marko, Harald Rose
Journal of Electron Microscopy|May 11, 2002
Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part II)Christoph Weitbssäcker, Harald Rose
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2022
Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick SamplesZhongbo Li, Johannes Biskupek, Ute Kaiser, et al.
MRS Bulletin|January 13, 2021
Mrs Movers & ShakersHarald Rose, Maximilian Haider, Knut Urban, et al.
Ultramicroscopy|September 28, 2020
Lattice contrast in the core-loss EFTEM signal of grapheneMichael J Mohn, Johannes Biskupek, Zhongbo Lee, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 14, 2022
Computationally Efficient Handling of Partially Coherent Electron Sources in (S)TEM Image Simulations via Matrix DiagonalizationZhongbo Li, Harald Rose, Jacob Madsen, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 20, 2024
An Efficient Electron Ptychography Method for Retrieving the Object Spectrum from Only a Few IterationsZhongbo Li, Johannes Biskupek, Martin Linck, et al.
Journal of Electron Microscopy|April 29, 2009
First application of Cc-corrected imaging for high-resolution and energy-filtered TEMBernd Kabius, Peter Hartel, Maximilian Haider, et al.
Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.
Pageof 1

Showing results (1-10 of 10) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|February 18, 2022
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detectorHarald Rose
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 24, 2010
The contributions of Otto Scherzer (1909-1982) to the development of the electron microscopeMichael Marko, Harald Rose
Journal of Electron Microscopy|May 11, 2002
Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part II)Christoph Weitbssäcker, Harald Rose
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2022
Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick SamplesZhongbo Li, Johannes Biskupek, Ute Kaiser, et al.
MRS Bulletin|January 13, 2021
Mrs Movers & ShakersHarald Rose, Maximilian Haider, Knut Urban, et al.
Ultramicroscopy|September 28, 2020
Lattice contrast in the core-loss EFTEM signal of grapheneMichael J Mohn, Johannes Biskupek, Zhongbo Lee, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 14, 2022
Computationally Efficient Handling of Partially Coherent Electron Sources in (S)TEM Image Simulations via Matrix DiagonalizationZhongbo Li, Harald Rose, Jacob Madsen, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 20, 2024
An Efficient Electron Ptychography Method for Retrieving the Object Spectrum from Only a Few IterationsZhongbo Li, Johannes Biskupek, Martin Linck, et al.
Journal of Electron Microscopy|April 29, 2009
First application of Cc-corrected imaging for high-resolution and energy-filtered TEMBernd Kabius, Peter Hartel, Maximilian Haider, et al.
Physical Review Letters|August 27, 2016
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kVMartin Linck, Peter Hartel, Stephan Uhlemann, et al.
Pageof 1