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Applied Spectroscopy|December 10, 2003
Reflectometric study of contaminant layer on a probe windowHariyadi Soetedjo, Jukka RätyThin Solid Films|June 2, 2010
Optical Properties of Single-Wall Carbon Nanotube Films Deposited on Si/SiO(2) WafersHariyadi Soetedjo, Maria F Mora, Carlos D GarciaPageof 1