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Heather J Patrick

Showing results (1-10 of 5) with videos related to

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Applied Optics|March 17, 2026
Improved ultraviolet measurement capabilities of NIST's reference transmittance spectrophotometerCatherine C Cooksey, Thomas C Larason, Heather J Patrick, et al.
Applied Optics|August 19, 2016
Optical reflectance of pyrheliometer absorption cavities: progress toward SI-traceable measurements of solar irradianceHeather J Patrick, Thomas A Germer, Clarence J Zarobila, et al.
Applied Optics|October 6, 2021
Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering InstrumentHeather J Patrick, Catherine C Cooksey, Thomas A Germer, et al.
Proceedings of Spie--The International Society for Optical Engineering|May 9, 2022
Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusersPaul Lemaillet, Heather J Patrick, Thomas A Germer, et al.
Applied Optics|June 21, 2007
Scatterfield microscopy for extending the limits of image-based optical metrologyRichard M Silver, Bryan M Barnes, Ravikiran Attota, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Applied Optics|March 17, 2026
Improved ultraviolet measurement capabilities of NIST's reference transmittance spectrophotometerCatherine C Cooksey, Thomas C Larason, Heather J Patrick, et al.
Applied Optics|August 19, 2016
Optical reflectance of pyrheliometer absorption cavities: progress toward SI-traceable measurements of solar irradianceHeather J Patrick, Thomas A Germer, Clarence J Zarobila, et al.
Applied Optics|October 6, 2021
Bidirectional reflectance capabilities of the NIST Robotic Optical Scattering InstrumentHeather J Patrick, Catherine C Cooksey, Thomas A Germer, et al.
Proceedings of Spie--The International Society for Optical Engineering|May 9, 2022
Goniometric and hemispherical reflectance and transmittance measurements of fused silica diffusersPaul Lemaillet, Heather J Patrick, Thomas A Germer, et al.
Applied Optics|June 21, 2007
Scatterfield microscopy for extending the limits of image-based optical metrologyRichard M Silver, Bryan M Barnes, Ravikiran Attota, et al.
Pageof 1