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Ultramicroscopy|January 7, 2023
Decomposition of CrN induced by laser-assisted atom probe tomographyHelene Waldl, Marcus Hans, Maximilian Schiester, et al.Ultramicroscopy|December 31, 2022
Efficient preparation of microtip arrays for atom probe tomography using fs-laser processingMichael Tkadletz, Helene Waldl, Maximilian Schiester, et al.Nanomaterials (Basel, Switzerland)|January 10, 2025
Reliable Atom Probe Tomography of Cu Nanoparticles Through Tailored Encapsulation by an Electrodeposited FilmAydan Çiçek, Florian Knabl, Maximilian Schiester, et al.Ultramicroscopy|January 21, 2025
Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument studyMaximilian Schiester, Helene Waldl, Katherine P Rice, et al.Ultramicroscopy|June 25, 2025
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of NSaeideh Naghdali, Maximilian Schiester, Helene Waldl, et al.Pageof 1