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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 26, 2000
Analysis of Three-dimensional Atom-probe Data by the Proximity HistogramHellman, Vandenbroucke, Rüsing, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 26, 2000
Three-dimensional Investigation of Ceramic/Metal Heterophase Interfaces by Atom-probe MicroscopyRüsing, Sebastian, Hellman, et al.
Nanotechnology|April 14, 2016
Evidence of sub-10 nm aluminum-oxygen precipitates in siliconOussama Moutanabbir, Dieter Isheim, Zugang Mao, et al.
Nanotechnology|October 10, 2014
Preparation of nanowire specimens for laser-assisted atom probe tomographyH Blumtritt, D Isheim, S Senz, et al.
Ultramicroscopy|April 4, 2007
Effects of 10 MeV electron irradiation at high temperature of a Ni-Mo-based HastelloyN Wanderka, A Bakai, C Abromeit, et al.
Ultramicroscopy|June 23, 2015
C12/C13-ratio determination in nanodiamonds by atom-probe tomographyJosiah B Lewis, Dieter Isheim, Christine Floss, et al.
Nano Letters|January 8, 2016
Laser-Assisted Field Evaporation and Three-Dimensional Atom-by-Atom Mapping of Diamond Isotopic HomojunctionsSamik Mukherjee, Hideyuki Watanabe, Dieter Isheim, et al.
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