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Microscopy (Oxford, England)|January 6, 2015
Laser-assisted sample preparation of silicon for high-resolution transmission electron microscopyNorihito Sakaguchi, Munehiro Kozuka, Hideki IchinoseJournal of Electron Microscopy|March 13, 2003
Imaging of a single atomic column in silicon grain boundaryHidetaka Sawada, Hideki Ichinose, Masanori KohyamaJournal of Electron Microscopy|November 29, 2002
Atomic structure observation of silicon carbide using HRTEMEriko Takuma, Hideki Ichinose, Fu-Rong ChenJournal of Electron Microscopy|May 14, 2003
ARHVTEM of the Pd/ZnO heterointerface chemical structureKenji Murakami, Mitsuhiro Saito, Eriko Takuma, et al.Bio-Medical Materials and Engineering|July 8, 2009
Low-voltage and high-voltage TEM observations on MWCNTs of rat in vivoNorihito Sakaguchi, Fumio Watari, Atsuro Yokoyama, et al.Journal of Electron Microscopy|June 25, 2010
Transmission electron microscopic observation of cells cultured on multiwalled carbon nanotube-coated spongesEri Hirata, Norihito Sakaguchi, Motohiro Uo, et al.Pageof 1