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Proceedings of the National Academy of Sciences of the United States of America|February 23, 2021
Hard X-ray omnidirectional differential phase and dark-field imagingHongchang Wang, Kawal SawhneyThe Review of Scientific Instruments|June 3, 2016
Speckle-based at-wavelength metrology of X-ray mirrors with super accuracyYogesh Kashyap, Hongchang Wang, Kawal SawhneyLight, Science & Applications|September 23, 2021
Nano-precision metrology of X-ray mirrors with laser speckle angular measurementHongchang Wang, Simone Moriconi, Kawal SawhneyJournal of Synchrotron Radiation|July 30, 2024
Spexwavepy: an open-source Python package for X-ray wavefront sensing using speckle-based techniquesLingfei Hu, Hongchang Wang, Kawal SawhneyPhysical Review Letters|March 28, 2015
Hard-X-ray directional dark-field imaging using the speckle scanning techniqueHongchang Wang, Yogesh Kashyap, Kawal SawhneyScientific Reports|February 6, 2016
From synchrotron radiation to lab source: advanced speckle-based X-ray imaging using abrasive paperHongchang Wang, Yogesh Kashyap, Kawal SawhneyOptics Express|September 15, 2015
Speckle based X-ray wavefront sensing with nanoradian angular sensitivityHongchang Wang, Yogesh Kashyap, Kawal SawhneyJournal of Synchrotron Radiation|September 1, 2016
Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrorsYogesh Kashyap, Hongchang Wang, Kawal SawhneyOptics Express|April 4, 2015
Advanced in situ metrology for x-ray beam shaping with super precisionHongchang Wang, John Sutter, Kawal SawhneyOptics Express|August 10, 2016
Experimental comparison between speckle and grating-based imaging technique using synchrotron radiation X-raysYogesh Kashyap, Hongchang Wang, Kawal SawhneyPageof 13