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Hu-Gui Jin

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Optics Express|August 13, 2025

Accurate thickness measurement method for thin layer in thick materials using terahertz technologySen-Cheng Zhong, Liang-Hui Du, Hu-Gui Jin, et al.

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Search research articles

Showing results (1-10 of 1) with videos related to

Sort By:

Pageof 1

Optics Express|August 13, 2025

Accurate thickness measurement method for thin layer in thick materials using terahertz technologySen-Cheng Zhong, Liang-Hui Du, Hu-Gui Jin, et al.

Pageof 1