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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 3, 2012
Partial acceptor photobleaching-based quantitative FRET method completely overcoming emission spectral crosstalksHuali Li, Huaina Yu, Tongsheng ChenMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 26, 2013
Ma-PbFRET: multiple acceptors FRET measurement based on partial acceptor photobleachingHuaina Yu, Jianwei Zhang, Huali Li, et al.Optics Express|December 25, 2015
Numerical analysis of partially coherent radiation at soft x-ray beamlineXiangyu Meng, Chaofan Xue, Huaina Yu, et al.Optics Express|June 11, 2024
Multilayer Kirkpatrick-Baez focusing mirrors with phase compensation for sub-20 nm focusing at the hard X-ray nanoprobe beamline of SSRFHui Jiang, Jianan Xie, Yan He, et al.Journal of Synchrotron Radiation|December 6, 2024
Development and testing of a dual-frequency real-time hardware feedback system for the hard X-ray nanoprobe beamline of the SSRFZhisen Jiang, Hui Jiang, Yinghua He, et al.Journal of Nanoscience and Nanotechnology|April 24, 2018
Surface States in Ternary CdSSe Quantum Dot Solar CellsZhenhua Chen, Hui Li, Xiangzhi Zhang, et al.Journal of Synchrotron Radiation|May 5, 2021
Analysis of partially coherent light propagation through the soft X-ray interference lithography beamline at SSRFXiangyu Meng, Huaina Yu, Yong Wang, et al.The Review of Scientific Instruments|May 3, 2019
Soft x-ray spectroscopic endstation at beamline 08U1A of Shanghai Synchrotron Radiation FacilityHaigang Liu, Jiefeng Cao, Yong Wang, et al.Pageof 1