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Journal of Nanoscience and Nanotechnology|April 22, 2014
Full field analysis of critical dimension uniformity due to focal variation for contact features in extreme ultraviolet lithographyHung-Fei Kuo, FrederickJournal of Nanoscience and Nanotechnology|April 17, 2014
Gaussian beam incident on the one-dimensional diffraction gratings with the high-K metal gate stack structuresHung-Fei Kuo, FrederickIEEE Transactions on Nanobioscience|May 27, 2015
Investigation of Various Types of Nanorods as Sensitive Surface-Enhanced Raman Scattering SubstratesHung-Fei Kuo, Yi-Jun Huang, Yu-Ting ChenPageof 1