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Applied Optics|October 20, 2005
Discrepancies between roughness measurements obtained with phase-shifting and white-light interferometryHyug-Gyo Rhee, Theodore V Vorburger, Jonathan W Lee, et al.Optics Express|January 26, 2012
Enhancement of height resolution in direct laser lithographyHyug-Gyo Rhee, Yun-Woo LeeOptics Express|February 23, 2010
Improvement of linewidth in laser beam lithographed computer generated hologramHyug-Gyo Rhee, Yun-Woo LeeApplied Optics|October 10, 2002
Absolute distance measurement by two-point-diffraction interferometryHyug-Gyo Rhee, Seung-Woo KimOptics Letters|November 16, 2019
Instantaneous thickness measurement of multilayer films by single-shot angle-resolved spectral reflectometryYoung-Sik Ghim, Hyug-Gyo RheeOptics Express|June 18, 2009
Absolute three-dimensional coordinate measurement by the two-point diffraction interferometryHyug-Gyo Rhee, Jiyoung Chu, Yun-Woo LeeScientific Reports|September 21, 2017
Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structureYoung-Sik Ghim, Hyug-Gyo Rhee, Angela DaviesScientific Reports|March 1, 2019
Single-shot deflectometry for dynamic 3D surface profile measurement by modified spatial-carrier frequency phase-shifting methodManh The Nguyen, Young-Sik Ghim, Hyug-Gyo RheeOptics Express|June 17, 2009
Azimuthal position error correction algorithm for absolute test of large optical surfacesHyug-Gyo Rhee, Yun-Woo Lee, Seung-Woo KimThe Review of Scientific Instruments|August 7, 2009
Realization and performance evaluation of high speed autofocusing for direct laser lithographyHyug-Gyo Rhee, Dong-Ik Kim, Yun-Woo LeePageof 7