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Nanotechnology|August 19, 2009
Fast spiral-scan atomic force microscopyI A Mahmood, S O Reza MoheimaniThe Review of Scientific Instruments|July 2, 2009
Making a commercial atomic force microscope more accurate and faster using positive position feedback controlI A Mahmood, S O Reza MoheimaniThe Review of Scientific Instruments|August 7, 2008
Invited review article: accurate and fast nanopositioning with piezoelectric tube scanners: emerging trends and future challengesS O Reza MoheimaniThe Review of Scientific Instruments|January 10, 2025
Constant di/dz scanning tunneling microscopy: Atomic precision imaging and hydrogen depassivation lithography on a Si(100)-2 × 1:H surfaceRicha Mishra, S O Reza MoheimaniThe Review of Scientific Instruments|August 7, 2009
Signal transformation approach to fast nanopositioningAbu Sebastian, S O Reza MoheimaniThe Review of Scientific Instruments|January 7, 2014
A novel self-sensing technique for tapping-mode atomic force microscopyMichael G Ruppert, S O Reza MoheimaniThe Review of Scientific Instruments|August 7, 2008
Simultaneous sensing and actuation with a piezoelectric tube scannerS O Reza Moheimani, Yuen K YongBeilstein Journal of Nanotechnology|March 16, 2016
High-bandwidth multimode self-sensing in bimodal atomic force microscopyMichael G Ruppert, S O Reza MoheimaniThe Review of Scientific Instruments|August 3, 2019
Rosette-scan video-rate atomic force microscopy: Trajectory patterning and control designNastaran Nikooienejad, Mohammad Maroufi, S O Reza MoheimaniNanotechnology|August 6, 2011
High-bandwidth control of a piezoelectric nanopositioning stage in the presence of plant uncertaintiesSumeet S Aphale, Santosh Devasia, S O Reza MoheimaniPageof 3