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I S Gilmore

Showing results (1-10 of 15) with videos related to

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The Journal of Physical Chemistry. B|February 18, 2016
Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth ProfilesR Havelund, M P Seah, I S Gilmore
Journal of the American Society for Mass Spectrometry|March 1, 2006
TOF-SIMS: accurate mass scale calibrationF M Green, I S Gilmore, M P Seah
Analytical Chemistry|April 5, 2011
Mass spectrometry and informatics: distribution of molecules in the PubChem database and general requirements for mass accuracy in surface analysisF M Green, I S Gilmore, M P Seah
Journal of the American Society for Mass Spectrometry|February 23, 2018
SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary IonsR Havelund, M P Seah, M Tiddia, et al.
Journal of the American Society for Mass Spectrometry|October 25, 2018
Quantifying SIMS of Organic Mixtures and Depth Profiles-Characterizing Matrix Effects of Fragment IonsM P Seah, R Havelund, S J Spencer, et al.
The Journal of Physical Chemistry. B|October 1, 2015
Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster IonsM P Seah, R Havelund, A G Shard, et al.
Analytical Chemistry|January 2, 2009
Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profilingF M Green, A G Shard, I S Gilmore, et al.
The Analyst|March 31, 2010
The effect of electrospray solvent composition on desorption electrospray ionisation (DESI) efficiency and spatial resolutionF M Green, T L Salter, I S Gilmore, et al.
Analytical Chemistry|January 10, 2013
Ambient surface mass spectrometry using plasma-assisted desorption ionization: effects and optimization of analytical parameters for signal intensities of molecules and polymersT L Salter, I S Gilmore, A Bowfield, et al.
The Analyst|September 2, 2015
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster sizeM P Seah, S J Spencer, R Havelund, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
The Journal of Physical Chemistry. B|February 18, 2016
Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth ProfilesR Havelund, M P Seah, I S Gilmore
Journal of the American Society for Mass Spectrometry|March 1, 2006
TOF-SIMS: accurate mass scale calibrationF M Green, I S Gilmore, M P Seah
Analytical Chemistry|April 5, 2011
Mass spectrometry and informatics: distribution of molecules in the PubChem database and general requirements for mass accuracy in surface analysisF M Green, I S Gilmore, M P Seah
Journal of the American Society for Mass Spectrometry|February 23, 2018
SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary IonsR Havelund, M P Seah, M Tiddia, et al.
Journal of the American Society for Mass Spectrometry|October 25, 2018
Quantifying SIMS of Organic Mixtures and Depth Profiles-Characterizing Matrix Effects of Fragment IonsM P Seah, R Havelund, S J Spencer, et al.
The Journal of Physical Chemistry. B|October 1, 2015
Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster IonsM P Seah, R Havelund, A G Shard, et al.
Analytical Chemistry|January 2, 2009
Analysis of the interface and its position in C60(n+) secondary ion mass spectrometry depth profilingF M Green, A G Shard, I S Gilmore, et al.
The Analyst|March 31, 2010
The effect of electrospray solvent composition on desorption electrospray ionisation (DESI) efficiency and spatial resolutionF M Green, T L Salter, I S Gilmore, et al.
Analytical Chemistry|January 10, 2013
Ambient surface mass spectrometry using plasma-assisted desorption ionization: effects and optimization of analytical parameters for signal intensities of molecules and polymersT L Salter, I S Gilmore, A Bowfield, et al.
The Analyst|September 2, 2015
Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster sizeM P Seah, S J Spencer, R Havelund, et al.
Pageof 2