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Ian D Lindsay

Showing results (1-10 of 5) with videos related to

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Sensors (Basel, Switzerland)|March 26, 2022
Shedding Light on Capillary-Based Backscattering InterferometryNiall M C Mulkerns, William H Hoffmann, Ian D Lindsay, et al.
Sensors (Basel, Switzerland)|June 10, 2022
An Analysis of Semicircular Channel Backscattering Interferometry through Ray Tracing SimulationsNiall M C Mulkerns, William H Hoffmann, Ian D Lindsay, et al.
Optics Express|November 24, 2011
Incoherently pumped continuous wave optical parametric oscillator broadened by non-collinear phasematchingJelle Storteboom, Chris J Lee, Ab F Nieuwenhuis, et al.
Ultramicroscopy|December 30, 2014
Optical imaging beyond the diffraction limit by SNEM: effects of AFM tip modifications with thiol monolayers on imaging qualityAysegul Cumurcu, Jordi Diaz, Ian D Lindsay, et al.
Nanoscale|May 26, 2022
Measuring the refractive index and sub-nanometre surface functionalisation of nanoparticles in suspensionNiall M C Mulkerns, William H Hoffmann, Javier Ramos-Soriano, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Sensors (Basel, Switzerland)|March 26, 2022
Shedding Light on Capillary-Based Backscattering InterferometryNiall M C Mulkerns, William H Hoffmann, Ian D Lindsay, et al.
Sensors (Basel, Switzerland)|June 10, 2022
An Analysis of Semicircular Channel Backscattering Interferometry through Ray Tracing SimulationsNiall M C Mulkerns, William H Hoffmann, Ian D Lindsay, et al.
Optics Express|November 24, 2011
Incoherently pumped continuous wave optical parametric oscillator broadened by non-collinear phasematchingJelle Storteboom, Chris J Lee, Ab F Nieuwenhuis, et al.
Ultramicroscopy|December 30, 2014
Optical imaging beyond the diffraction limit by SNEM: effects of AFM tip modifications with thiol monolayers on imaging qualityAysegul Cumurcu, Jordi Diaz, Ian D Lindsay, et al.
Nanoscale|May 26, 2022
Measuring the refractive index and sub-nanometre surface functionalisation of nanoparticles in suspensionNiall M C Mulkerns, William H Hoffmann, Javier Ramos-Soriano, et al.
Pageof 1