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Ian MacLaren

Showing results (1-10 of 35) with videos related to

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Langmuir : the ACS Journal of Surfaces and Colloids|November 17, 2006
Investigations of the antibacterial properties of ciprofloxacin@SiO2M J Rosemary, Ian MacLaren, T Pradeep
Ultramicroscopy|January 22, 2026
Towards large-area EELS mapping of precipitates in a steel matrix: Comparing low loss and high loss quantificationAlan J Craven, Bianca Sala, Ian MacLaren
Ultramicroscopy|December 3, 2014
Spectrum imaging of complex nanostructures using DualEELS: I. Digital extraction replicasJoanna Bobynko, Ian MacLaren, Alan J Craven
Nanoscale|July 22, 2010
Superconducting tantalum disulfide nanotapes; growth, structure and stoichiometryCharles W Dunnill, Ian MacLaren, Duncan H Gregory
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 31, 2019
Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam MicroscopeIan MacLaren, Magnus Nord, Chengge Jiao, et al.
Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.
Ultramicroscopy|August 30, 2016
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sectionsAlan J Craven, Joanna Bobynko, Bianca Sala, et al.
Ultramicroscopy|December 24, 2017
Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standardsAlan J Craven, Bianca Sala, Joanna Bobynko, et al.
Journal of Microscopy|February 14, 2024
A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software librariesIan MacLaren, Enrique Frutos-Myro, Steven Zeltmann, et al.
Microscopy (Oxford, England)|October 17, 2017
EELS at very high energy lossesIan MacLaren, Kirsty J Annand, Colin Black, et al.
Pageof 4

Showing results (1-10 of 35) with videos related to

Sort By:
Pageof 4
Langmuir : the ACS Journal of Surfaces and Colloids|November 17, 2006
Investigations of the antibacterial properties of ciprofloxacin@SiO2M J Rosemary, Ian MacLaren, T Pradeep
Ultramicroscopy|January 22, 2026
Towards large-area EELS mapping of precipitates in a steel matrix: Comparing low loss and high loss quantificationAlan J Craven, Bianca Sala, Ian MacLaren
Ultramicroscopy|December 3, 2014
Spectrum imaging of complex nanostructures using DualEELS: I. Digital extraction replicasJoanna Bobynko, Ian MacLaren, Alan J Craven
Nanoscale|July 22, 2010
Superconducting tantalum disulfide nanotapes; growth, structure and stoichiometryCharles W Dunnill, Ian MacLaren, Duncan H Gregory
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 31, 2019
Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam MicroscopeIan MacLaren, Magnus Nord, Chengge Jiao, et al.
Ultramicroscopy|April 6, 2017
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical couplingAlan J Craven, Hidetaka Sawada, Sam McFadzean, et al.
Ultramicroscopy|August 30, 2016
Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sectionsAlan J Craven, Joanna Bobynko, Bianca Sala, et al.
Ultramicroscopy|December 24, 2017
Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standardsAlan J Craven, Bianca Sala, Joanna Bobynko, et al.
Journal of Microscopy|February 14, 2024
A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software librariesIan MacLaren, Enrique Frutos-Myro, Steven Zeltmann, et al.
Microscopy (Oxford, England)|October 17, 2017
EELS at very high energy lossesIan MacLaren, Kirsty J Annand, Colin Black, et al.
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