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Journal of Applied Crystallography|June 29, 2017
Incorporation of interfacial roughness into recursion matrix formalism of dynamical X-ray diffraction in multilayers and superlatticesIhar Lobach, Andrei Benediktovitch, Alexander UlyanenkovPhysical Review Letters|April 16, 2021
Transverse Beam Emittance Measurement by Undulator Radiation Power NoiseIhar Lobach, Sergei Nagaitsev, Valeri Lebedev, et al.Pageof 1