Imee Rose Tagaca - JoVE Visualize

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Applied Optics|November 2, 2007

Fault localization and analysis in semiconductor devices with optical-feedback infrared confocal microscopyRaymund Sarmiento, Vernon Julius Cemine, Imee Rose Tagaca, et al.

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Applied Optics|November 2, 2007

Fault localization and analysis in semiconductor devices with optical-feedback infrared confocal microscopyRaymund Sarmiento, Vernon Julius Cemine, Imee Rose Tagaca, et al.

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