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The Review of Scientific Instruments|April 8, 2010
Simultaneously measured signals in scanning probe microscopy with a needle sensor: frequency shift and tunneling currentIreneusz Morawski, Bert VoigtländerThe Review of Scientific Instruments|July 5, 2011
Voltage preamplifier for extensional quartz sensors used in scanning force microscopyIreneusz Morawski, Józef Blicharski, Bert VoigtländerThe Review of Scientific Instruments|January 3, 2016
Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applicationsIreneusz Morawski, Richard Spiegelberg, Stefan Korte, et al.Journal of Microscopy|June 25, 2025
Electrochemical scanning tunnelling microscopy: Concept, experiment, and application to organic layers on electrified surfacesTomasz Kosmala, Bartosz Mądry, Paulina Wira, et al.Pageof 1