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The Journal of Physical Chemistry. A|May 3, 2016
Dissociation Dynamics of Molecular Ions in High dc Electric FieldIvan Blum, Lorenzo Rigutti, François Vurpillot, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 11, 2017
Field-Dependent Measurement of GaAs Composition by Atom Probe TomographyEnrico Di Russo, Ivan Blum, Jonathan Houard, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 9, 2017
Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage PulsingLu Zhao, Antoine Normand, Jonathan Houard, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 13, 2024
Crystallographic Dependence of Field Evaporation Energy Barrier in Metals Using Field Evaporation Energy Loss Spectroscopy MappingFrançois Vurpillot, Constantinos Hatzoglou, Benjamin Klaes, et al.
Ultramicroscopy|April 9, 2019
Conduction mechanisms and voltage drop during field electron emission from diamond needlesOlivier Torresin, Mario Borz, Julien Mauchain, et al.
The Journal of Physical Chemistry Letters|January 24, 2019
Unraveling the Metastability of C n2+ ( n = 2-4) ClustersZirong Peng, David Zanuttini, Benoit Gervais, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 15, 2026
Exploring Mechanisms Leading to Composition Errors in Monazite (CePO4) Analyzed With Atom Probe TomographyTom Veret, Fabien Delaroche, Ivan Blum, et al.
Nano Letters|June 28, 2017
Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional MultimicroscopyLorenzo Mancini, Florian Moyon, David Hernàndez-Maldonado, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 15, 2026
Chromium- and Monolayer Graphene-Based Coating for THz-Assisted Atom Probe Tomography of Sol-Gel Silica SpecimensMatteo De Tullio, Florant Exertier, Ivan Blum, et al.
Nano Letters|January 9, 2014
Correlation of microphotoluminescence spectroscopy, scanning transmission electron microscopy, and atom probe tomography on a single nano-object containing an InGaN/GaN multiquantum well systemLorenzo Rigutti, Ivan Blum, Deodatta Shinde, et al.
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