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Langmuir : the ACS Journal of Surfaces and Colloids|June 24, 2025
Silver-Surface-Enhanced Raman Spectra of Berberine: Analyte-Induced Surface Changes, Variable Concentration Correlation, and Excitation Wavelength DependenceIvan Kopal, Valerie Smeliková
Polymers|April 11, 2019
Modeling the Temperature Dependence of Dynamic Mechanical Properties and Visco-Elastic Behavior of Thermoplastic Polyurethane Using Artificial Neural NetworkIvan Kopal, Marta Harničárová, Jan Valíček, et al.
ACS Omega|June 17, 2024
Characterization of Modified PVDF Membranes Using Fourier Transform Infrared and Raman Microscopy and Infrared Nanoimaging: Challenges and Advantages of Individual MethodsMatěj Kmetík, Ivan Kopal, Martin Král, et al.
Polymers|April 11, 2019
Prediction of the Tensile Response of Carbon Black Filled Rubber Blends by Artificial Neural NetworkIvan Kopal, Ivan Labaj, Marta Harničárová, et al.
Polymers|June 26, 2019
Radial Basis Function Neural Network-Based Modeling of the Dynamic Thermo-Mechanical Response and Damping Behavior of Thermoplastic Elastomer SystemsIvan Kopal, Marta Harničárová, Jan Valíček, et al.
Polymers|November 27, 2025
Innovative Carbon Black Replacement in Rubber Compound: Impact of Pyrolytic Carbon Black and Energy-Gypsum By-Products on Vulcanization and PropertiesIvan Labaj, Juliána Vršková, Ivan Kopal, et al.
Analytical Chemistry|March 7, 2024
Unveiling the Crucial Role of Chemical Enhancement in the SERS Analysis of Amphetamine-Metal Interactions on Gold and Silver Surfaces: Importance of Selective Amplification of the Narrow Interval of Vibrational ModesValerie Smeliková, Ivan Kopal, Martin Člupek, et al.
Communications Chemistry|July 17, 2026
Reconstructing high-order SERS transitions in an overlooked spectral region reveals surface complex formationIvan Kopal, Matěj Kmetík, Pavel Matějka, et al.
Polymers|September 9, 2023
Intelligent Modelling of the Real Dynamic Viscosity of Rubber Blends Using Parallel ComputingIvan Kopal, Ivan Labaj, Juliána Vršková, et al.
ACS Photonics|October 21, 2024
Surpassing the Diffraction Limit in Label-Free Optical MicroscopyDavid Palounek, Milan Vala, Łukasz Bujak, et al.
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