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Ultramicroscopy|June 16, 2021
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopyIwona Jóźwik, Jacek Jagielski, Ewa Dumiszewska, et al.Journal of Visualized Experiments : Jove|May 19, 2020
3D Depth Profile Reconstruction of Segregated Impurities using Secondary Ion Mass SpectrometryPaweł Piotr Michałowski, Sebastian Zlotnik, Iwona Jóźwik, et al.Ultramicroscopy|May 21, 2019
Damage-induced voltage alteration (DIVA) contrast in SEM images of ion-irradiated semiconductorsIwona Jóźwik, Adam Barcz, Elżbieta Dąbrowska, et al.Microscopy Research and Technique|February 22, 2018
High resolution SEM characterization of nano-precipitates in ODS steelsIwona Jóźwik, Agata Strojny-Nędza, Marcin Chmielewski, et al.Molecules (Basel, Switzerland)|June 10, 2022
Formation of GeO<sub>2</sub> under Graphene on Ge(001)/Si(001) Substrates Using Water VaporEwa Dumiszewska, Paweł Ciepielewski, Piotr A Caban, et al.Materials (Basel, Switzerland)|April 27, 2024
Effect of Nitrogen Atmosphere Annealing of Alloyed Powders on the Microstructure and Properties of ODS Ferritic SteelsAgata Strojny-Nędza, Katarzyna Pietrzak, Iwona Jóźwik, et al.Nanoscale|June 17, 2025
Nanoscale defect formation in fcc Ni and low-Fe content Ni<sub><i>x</i></sub>Fe<sub>1-<i>x</i></sub> single crystals induced by self-ion irradiationEdyta Wyszkowska, Cyprian Mieszczyński, Amil Aligayev, et al.Nature Nanotechnology|September 22, 2022
Oxycarbide MXenes and MAX phases identification using monoatomic layer-by-layer analysis with ultralow-energy secondary-ion mass spectrometryPaweł P Michałowski, Mark Anayee, Tyler S Mathis, et al.Pageof 1