Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Jürgen W Gerlach

Showing results (1-10 of 13) with videos related to

Pageof 2
Sort By:
Materials (Basel, Switzerland)|September 9, 2017
Thin Film Deposition Using Energetic IonsDarina Manova, Jürgen W Gerlach, Stephan Mändl
Ultramicroscopy|July 28, 2006
Static-charging mitigation and contamination avoidance by selective carbon coating of TEM samplesThomas Höche, Jürgen W Gerlach, Tino Petsch
Beilstein Journal of Nanotechnology|March 31, 2018
Comparative study of sculptured metallic thin films deposited by oblique angle deposition at different temperaturesSusann Liedtke, Christoph Grüner, Jürgen W Gerlach, et al.
Materials (Basel, Switzerland)|August 5, 2017
Ion Beam Assisted Deposition of Thin Epitaxial GaN FilmsBernd Rauschenbach, Andriy Lotnyk, Lena Neumann, et al.
Scientific Reports|June 30, 2018
Detection of small bunches of ions using image chargesPaul Räcke, Daniel Spemann, Jürgen W Gerlach, et al.
Materials (Basel, Switzerland)|May 7, 2020
Structural Transitions in Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> Phase Change Memory Thin Films Induced by Nanosecond UV Optical PulsesMario Behrens, Andriy Lotnyk, Hagen Bryja, et al.
ACS Applied Materials & Interfaces|October 16, 2019
Direct Measurement of Crystal Growth Velocity in Epitaxial Phase-Change Material Thin FilmsMario Behrens, Andriy Lotnyk, Jürgen W Gerlach, et al.
Physical Review Letters|September 4, 2008
Ion-beam-induced collective rotation of nanocrystalsIvo Zizak, Nora Darowski, Siegfried Klaumünzer, et al.
Micron (Oxford, England : 1993)|April 8, 2015
An aberration-corrected STEM study of structural defects in epitaxial GaN thin films grown by ion beam assisted MBEDavid Poppitz, Andriy Lotnyk, Jürgen W Gerlach, et al.
Nanoscale|December 1, 2018
Ultrafast interfacial transformation from 2D- to 3D-bonded structures in layered Ge-Sb-Te thin films and heterostructuresMario Behrens, Andriy Lotnyk, Jürgen W Gerlach, et al.
Pageof 2

Showing results (1-10 of 13) with videos related to

Sort By:
Pageof 2
Materials (Basel, Switzerland)|September 9, 2017
Thin Film Deposition Using Energetic IonsDarina Manova, Jürgen W Gerlach, Stephan Mändl
Ultramicroscopy|July 28, 2006
Static-charging mitigation and contamination avoidance by selective carbon coating of TEM samplesThomas Höche, Jürgen W Gerlach, Tino Petsch
Beilstein Journal of Nanotechnology|March 31, 2018
Comparative study of sculptured metallic thin films deposited by oblique angle deposition at different temperaturesSusann Liedtke, Christoph Grüner, Jürgen W Gerlach, et al.
Materials (Basel, Switzerland)|August 5, 2017
Ion Beam Assisted Deposition of Thin Epitaxial GaN FilmsBernd Rauschenbach, Andriy Lotnyk, Lena Neumann, et al.
Scientific Reports|June 30, 2018
Detection of small bunches of ions using image chargesPaul Räcke, Daniel Spemann, Jürgen W Gerlach, et al.
Materials (Basel, Switzerland)|May 7, 2020
Structural Transitions in Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> Phase Change Memory Thin Films Induced by Nanosecond UV Optical PulsesMario Behrens, Andriy Lotnyk, Hagen Bryja, et al.
ACS Applied Materials & Interfaces|October 16, 2019
Direct Measurement of Crystal Growth Velocity in Epitaxial Phase-Change Material Thin FilmsMario Behrens, Andriy Lotnyk, Jürgen W Gerlach, et al.
Physical Review Letters|September 4, 2008
Ion-beam-induced collective rotation of nanocrystalsIvo Zizak, Nora Darowski, Siegfried Klaumünzer, et al.
Micron (Oxford, England : 1993)|April 8, 2015
An aberration-corrected STEM study of structural defects in epitaxial GaN thin films grown by ion beam assisted MBEDavid Poppitz, Andriy Lotnyk, Jürgen W Gerlach, et al.
Nanoscale|December 1, 2018
Ultrafast interfacial transformation from 2D- to 3D-bonded structures in layered Ge-Sb-Te thin films and heterostructuresMario Behrens, Andriy Lotnyk, Jürgen W Gerlach, et al.
Pageof 2