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Micron (Oxford, England : 1993)|December 10, 2013
Deep sub micrometer imaging of defects in copper pillars by X-ray tomography in a SEMD Laloum, F Lorut, J Bertheau, et al.
The Review of Scientific Instruments|March 8, 2013
Three-dimensional imaging of copper pillars using x-ray tomography within a scanning electron microscope: a simulation study based on synchrotron dataN Martin, J Bertheau, P Bleuet, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 12, 2013
Specifications for hard condensed matter specimens for three-dimensional high-resolution tomographiesP Bleuet, G Audoit, J-P Barnes, et al.
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