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Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2002
Kinematic and dynamical CBED for solving thin organic films at low temperature; experimental tests with anthraceneJ S Wu, J C H Spence
Acta Crystallographica. Section A, Foundations of Crystallography|February 23, 2005
Reconstruction of complex single-particle images using charge-flipping algorithmJ S Wu, J C H Spence
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
Ordering energies and occupancies in doped TiAl, and dedicated ALCHEMI instrumentationJ C H Spence, N Jiang, U Weierstall
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|June 14, 2003
Phase recovery and lensless imaging by iterative methods in optical, X-ray and electron diffractionJ C H Spence, U Weierstall, M Howells
Ultramicroscopy|September 29, 2004
Coherence and sampling requirements for diffractive imagingJ C H Spence, U Weierstall, M Howells
Reports on Progress in Physics. Physical Society (Great Britain)|September 15, 2012
X-ray lasers for structural and dynamic biologyJ C H Spence, U Weierstall, H N Chapman
The Review of Scientific Instruments|April 3, 2012
Injector for scattering measurements on fully solvated biospeciesU Weierstall, J C H Spence, R B Doak
Journal of Synchrotron Radiation|July 21, 2004
An assessment of approximating aspheres with more easily manufactured surfacesM R Howells, J Anspach, J Bender
Journal of Electron Spectroscopy and Related Phenomena|September 28, 2011
An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopyM R Howells, T Beetz, H N Chapman, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Convergent-beam low energy electron diffraction (CBLEED) and the measurement of surface dipole layersJ C H Spence, H C Poon, D K Saldin
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