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Science (New York, N.Y.)|December 4, 2004
Interface structure and atomic bonding characteristics in silicon nitride ceramicsA Ziegler, J C Idrobo, M K Cinibulk, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 17, 2009
Characterizing the two- and three-dimensional resolution of an improved aberration-corrected STEMA R Lupini, A Y Borisevich, J C Idrobo, et al.
Physical Review Letters|March 10, 2012
Atomic structure of highly strained BiFeO3 thin filmsM D Rossell, R Erni, M P Prange, et al.
Physical Review Letters|September 26, 2012
Observations of Co4+ in a higher spin state and the increase in the Seebeck coefficient of thermoelectric Ca3Co4O9R F Klie, Q Qiao, T Paulauskas, et al.
Ultramicroscopy|December 23, 2018
Progress in ultrahigh energy resolution EELSO L Krivanek, N Dellby, J A Hachtel, et al.
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