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Journal of Synchrotron Radiation
|
July 21, 2004
Bond lengths in semiconductor alloys
J C Woicik
Physical Chemistry Chemical Physics : PCCP
|
August 31, 2022
Revisiting the K-edge X-ray absorption fine structure of Si, Ge-Si alloys, and the isoelectronic series: CuBr, ZnSe, GaAs, and Ge
E L Shirley, J C Woicik
Physical Review Letters
|
October 4, 2000
Direct measurement of valence-charge asymmetry by x-ray standing waves
J C Woicik, E J Nelson, P Pianetta
Physical Review. B
|
January 2, 2023
Partial densities of states from x-ray absorption and Auger electron spectroscopy: Use of core-hole memory
Eric L Shirley, C Weiland, J C Woicik
Journal of Synchrotron Radiation
|
April 20, 2010
Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software
J C Woicik, B Ravel, D A Fischer, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
Reliability of structural parameters determined from DAFS data using the iterative dispersion integral algorithm
J O Cross, W T Elam, J C Woicik, et al.
Physical Review Letters
|
June 12, 2012
Structure of SrTiO3 films on Si
C Stephen Hellberg, Kristopher E Andersen, Hao Li, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
Layer perfection in ultrathin MOVPE-grown InAs layers buried in GaAs(001) studied by X-ray standing waves and photoluminescence spectroscopy
J A Gupta, J C Woicik, S P Watkins, et al.
Nature Communications
|
June 23, 2019
Local atomic order and hierarchical polar nanoregions in a classical relaxor ferroelectric
M Eremenko, V Krayzman, A Bosak, et al.
Physical Review Letters
|
August 23, 2002
Hybridization and bond-orbital components in site-specific X-ray photoelectron spectra of rutile TiO2
J C Woicik, E J Nelson, Leeor Kronik, et al.
Page
of 2
Search research articles
Search
Showing results (1-10 of 18) with videos related to
Sort By:
Page
of 2
Journal of Synchrotron Radiation
|
July 21, 2004
Bond lengths in semiconductor alloys
J C Woicik
Physical Chemistry Chemical Physics : PCCP
|
August 31, 2022
Revisiting the K-edge X-ray absorption fine structure of Si, Ge-Si alloys, and the isoelectronic series: CuBr, ZnSe, GaAs, and Ge
E L Shirley, J C Woicik
Physical Review Letters
|
October 4, 2000
Direct measurement of valence-charge asymmetry by x-ray standing waves
J C Woicik, E J Nelson, P Pianetta
Physical Review. B
|
January 2, 2023
Partial densities of states from x-ray absorption and Auger electron spectroscopy: Use of core-hole memory
Eric L Shirley, C Weiland, J C Woicik
Journal of Synchrotron Radiation
|
April 20, 2010
Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software
J C Woicik, B Ravel, D A Fischer, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
Reliability of structural parameters determined from DAFS data using the iterative dispersion integral algorithm
J O Cross, W T Elam, J C Woicik, et al.
Physical Review Letters
|
June 12, 2012
Structure of SrTiO3 films on Si
C Stephen Hellberg, Kristopher E Andersen, Hao Li, et al.
Journal of Synchrotron Radiation
|
July 21, 2004
Layer perfection in ultrathin MOVPE-grown InAs layers buried in GaAs(001) studied by X-ray standing waves and photoluminescence spectroscopy
J A Gupta, J C Woicik, S P Watkins, et al.
Nature Communications
|
June 23, 2019
Local atomic order and hierarchical polar nanoregions in a classical relaxor ferroelectric
M Eremenko, V Krayzman, A Bosak, et al.
Physical Review Letters
|
August 23, 2002
Hybridization and bond-orbital components in site-specific X-ray photoelectron spectra of rutile TiO2
J C Woicik, E J Nelson, Leeor Kronik, et al.
Page
of 2