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J C Zwinkels

Showing results (1-10 of 7) with videos related to

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Applied Optics|June 18, 2010
Determination of spectrophotometer polarization and its use in rapid accurate polarized transmission measurementsJ C Zwinkels, C X Dodd
Applied Optics|August 12, 2010
Automated high precision variable aperture for spectrophotometer linearity testingJ C Zwinkels, D S Gignac
Applied Optics|August 20, 2010
Design and testing of a new high-accuracy ultraviolet-visible-near-infrared spectrophotometerJ C Zwinkels, D S Gignac
Applied Optics|October 22, 2010
Procedures and standards for accurate spectrophotometric measurements of specular reflectanceJ C Zwinkels, M Noël, C X Dodd
Applied Optics|June 23, 2010
Optical properties of UV transmitting acrylics for use in a heavy water Cerenkov detectorJ C Zwinkels, W F Davidson, C X Dodd
Applied Optics|October 15, 1986
Development of optical monitor for control of thin-film depositionI P Powell, J C Zwinkels, A R Robertson
Applied Optics|February 1, 1997
Design and testing of a two-monochromator reference spectrofluorimeter for high-accuracy total radiance factor measurementsJ C Zwinkels, D S Gignac, M Nevins, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|June 18, 2010
Determination of spectrophotometer polarization and its use in rapid accurate polarized transmission measurementsJ C Zwinkels, C X Dodd
Applied Optics|August 12, 2010
Automated high precision variable aperture for spectrophotometer linearity testingJ C Zwinkels, D S Gignac
Applied Optics|August 20, 2010
Design and testing of a new high-accuracy ultraviolet-visible-near-infrared spectrophotometerJ C Zwinkels, D S Gignac
Applied Optics|October 22, 2010
Procedures and standards for accurate spectrophotometric measurements of specular reflectanceJ C Zwinkels, M Noël, C X Dodd
Applied Optics|June 23, 2010
Optical properties of UV transmitting acrylics for use in a heavy water Cerenkov detectorJ C Zwinkels, W F Davidson, C X Dodd
Applied Optics|October 15, 1986
Development of optical monitor for control of thin-film depositionI P Powell, J C Zwinkels, A R Robertson
Applied Optics|February 1, 1997
Design and testing of a two-monochromator reference spectrofluorimeter for high-accuracy total radiance factor measurementsJ C Zwinkels, D S Gignac, M Nevins, et al.
Pageof 1