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J Frejlich

Showing results (21-30 of 25) with videos related to

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Applied Optics|February 15, 1984
Gratings for metrology and process control. 2: Thin film thickness measurementG F Mendes, L H Cescato, J Frejlich
Applied Optics|August 20, 2010
Electrophotochromic gratings in photorefractive Bi(12)TiO(20) crystalsA A Kamshilin, J Frejlich, P M Garcia
Optics Letters|September 29, 2009
Selective two-wave mixing in photorefractive crystalsJ Frejlich, A A Kamshilin, P M Garcia
Optics Letters|October 29, 2009
Tilting of holograms in photorefractive Sr0.61Ba0.39Nb2O6 crystals by self-diffractionK Buse, S Kamper, J Frejlich, et al.
Optics Letters|October 30, 2009
Avoiding hologram bending in photorefractive crystalsA A Freschi, P M Garcia, I Rasnik, et al.
Pageof 3

Showing results (21-30 of 25) with videos related to

Sort By:
Pageof 3
You have reached the last page of results.This site can display upto 25 results.
Applied Optics|February 15, 1984
Gratings for metrology and process control. 2: Thin film thickness measurementG F Mendes, L H Cescato, J Frejlich
Applied Optics|August 20, 2010
Electrophotochromic gratings in photorefractive Bi(12)TiO(20) crystalsA A Kamshilin, J Frejlich, P M Garcia
Optics Letters|September 29, 2009
Selective two-wave mixing in photorefractive crystalsJ Frejlich, A A Kamshilin, P M Garcia
Optics Letters|October 29, 2009
Tilting of holograms in photorefractive Sr0.61Ba0.39Nb2O6 crystals by self-diffractionK Buse, S Kamper, J Frejlich, et al.
Optics Letters|October 30, 2009
Avoiding hologram bending in photorefractive crystalsA A Freschi, P M Garcia, I Rasnik, et al.
Pageof 3