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Applied Optics|September 24, 2010
Image scanning ellipsometry for measuring nonuniform film thickness profilesA H Liu, P C Wayner, J L Plawsky
Optics Letters|July 13, 2005
Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index materialJ Q Xi, Manas Ojha, Woojin Cho, et al.
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