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Applied Optics|November 12, 2010
Integrated optical waveguides: refractive-index profile control by temperature and electric-field programmingD Kapila, J L PlawskyApplied Optics|June 12, 2010
Optical fiber probes for particle size/velocity measurements: a simulation model. Part 1J L Plawsky, T A HattonApplied Optics|June 12, 2010
Optical fiber probes for particle size/velocity measurements: a simulation model. Part 2J L Plawsky, T A HattonApplied Optics|September 24, 2010
Image scanning ellipsometry for measuring nonuniform film thickness profilesA H Liu, P C Wayner, J L PlawskyOptics Letters|July 13, 2005
Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index materialJ Q Xi, Manas Ojha, Woojin Cho, et al.Pageof 1