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Journal of Nanoscience and Nanotechnology|June 10, 2009
Nanostructural characteristics and mechanical properties of low temperature plasma enhanced chemical vapor deposited silicon nitride thin filmsH Huang, J M Dell, S Liu
Applied Optics|March 8, 2008
Near band-edge field-dependent absorption coefficient and refractive index determined by photocurrent and transmittance measurementsM G Xu, J M Dell, J F Siliquini, et al.
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