Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

J M Franke

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
Applied Optics|March 10, 2010
Field-widened pinhole cameraJ M Franke
Applied Optics|March 1, 1983
Moire deflectometry with deferred analysisD B Rhodes, J M Franke, S B Jones, et al.
Applied Optics|January 30, 2010
Technique for fast measurement of gaussian laser beam parametersJ A Arnaud, W M Hubbard, G D Mandeville, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Applied Optics|March 10, 2010
Field-widened pinhole cameraJ M Franke
Applied Optics|March 1, 1983
Moire deflectometry with deferred analysisD B Rhodes, J M Franke, S B Jones, et al.
Applied Optics|January 30, 2010
Technique for fast measurement of gaussian laser beam parametersJ A Arnaud, W M Hubbard, G D Mandeville, et al.
Pageof 1