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J M K Wiezorek

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Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Determination of Debye-Waller factor and structure factors for Si by quantitative convergent-beam electron diffraction using off-axis multi-beam orientationsX H Sang, A Kulovits, J M K Wiezorek
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Simultaneous determination of highly precise Debye-Waller factors and structure factors for chemically ordered NiAlX H Sang, A Kulovits, J M K Wiezorek
Science (New York, N.Y.)|August 3, 2004
Grain boundary-mediated plasticity in nanocrystalline nickelZhiwei Shan, E A Stach, J M K Wiezorek, et al.
Physical Review Letters|March 21, 2008
Inter- and intra-agglomerate fracture in nanocrystalline nickelZhiwei Shan, J A Knapp, D M Follstaedt, et al.
Physical Review Letters|March 16, 2007
Dislocation dynamics in nanocrystalline nickelZ W Shan, J M K Wiezorek, E A Stach, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Determination of Debye-Waller factor and structure factors for Si by quantitative convergent-beam electron diffraction using off-axis multi-beam orientationsX H Sang, A Kulovits, J M K Wiezorek
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
Simultaneous determination of highly precise Debye-Waller factors and structure factors for chemically ordered NiAlX H Sang, A Kulovits, J M K Wiezorek
Science (New York, N.Y.)|August 3, 2004
Grain boundary-mediated plasticity in nanocrystalline nickelZhiwei Shan, E A Stach, J M K Wiezorek, et al.
Physical Review Letters|March 21, 2008
Inter- and intra-agglomerate fracture in nanocrystalline nickelZhiwei Shan, J A Knapp, D M Follstaedt, et al.
Physical Review Letters|March 16, 2007
Dislocation dynamics in nanocrystalline nickelZ W Shan, J M K Wiezorek, E A Stach, et al.
Pageof 1