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J M Titchmarsh

Showing results (1-10 of 3) with videos related to

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Ultramicroscopy|October 13, 2006
EFTEM assistant: a tool to understand the limitations of EFTEMS Lozano-Perez, J M Titchmarsh
Ultramicroscopy|November 29, 2005
On the importance of fifth-order spherical aberration for a fully corrected electron microscopeL Y Chang, A I Kirkland, J M Titchmarsh
Journal of Microscopy|August 16, 2002
Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam millingY Z Huang, S Lozano-Perez, R M Langford, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|October 13, 2006
EFTEM assistant: a tool to understand the limitations of EFTEMS Lozano-Perez, J M Titchmarsh
Ultramicroscopy|November 29, 2005
On the importance of fifth-order spherical aberration for a fully corrected electron microscopeL Y Chang, A I Kirkland, J M Titchmarsh
Journal of Microscopy|August 16, 2002
Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam millingY Z Huang, S Lozano-Perez, R M Langford, et al.
Pageof 1