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J P Borgogno

Showing results (1-10 of 7) with videos related to

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Applied Optics|June 18, 2010
Determination of the extinction coefficient of dielectric thin films from spectrophotometric measurementsJ P Borgogno, E Pelletier
Applied Optics|April 20, 2010
Automatic determination of the optical constants of inhomogeneous thin filmsJ P Borgogno, B Lazarides, E Pelletier
Applied Optics|November 1, 1986
In situ and air index measurements: influence of the deposition parameters on the shift of TiO2/SiO2 Fabry-Perot filtersB Schmitt, J P Borgogno, G Albrand, et al.
Applied Optics|November 2, 2010
Absorption mapping for characterization of glass surfacesM Commandré, P Roche, J P Borgogno, et al.
Applied Optics|November 25, 2010
Substrate effects on absorption of coated surfacesP Roche, M Commandré, L Escoubas, et al.
Applied Optics|March 24, 2010
Inhomogeneity in films: limitation of the accuracy of optical monitoring of thin filmsJ P Borgogno, P Bousquet, F Flory, et al.
Applied Optics|June 18, 2010
Comparison of the properties of titanium dioxide films prepared by various techniquesJ M Bennett, E Pelletier, G Albrand, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Optics|June 18, 2010
Determination of the extinction coefficient of dielectric thin films from spectrophotometric measurementsJ P Borgogno, E Pelletier
Applied Optics|April 20, 2010
Automatic determination of the optical constants of inhomogeneous thin filmsJ P Borgogno, B Lazarides, E Pelletier
Applied Optics|November 1, 1986
In situ and air index measurements: influence of the deposition parameters on the shift of TiO2/SiO2 Fabry-Perot filtersB Schmitt, J P Borgogno, G Albrand, et al.
Applied Optics|November 2, 2010
Absorption mapping for characterization of glass surfacesM Commandré, P Roche, J P Borgogno, et al.
Applied Optics|November 25, 2010
Substrate effects on absorption of coated surfacesP Roche, M Commandré, L Escoubas, et al.
Applied Optics|March 24, 2010
Inhomogeneity in films: limitation of the accuracy of optical monitoring of thin filmsJ P Borgogno, P Bousquet, F Flory, et al.
Applied Optics|June 18, 2010
Comparison of the properties of titanium dioxide films prepared by various techniquesJ M Bennett, E Pelletier, G Albrand, et al.
Pageof 1