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Analytical Chemistry|April 6, 2001
Automated single-particle SEM/EDX analysis of submicrometer particles down to 0.1 micromA Laskin, J P Cowin
The Review of Scientific Instruments|November 1, 1978
UHV application of spring-loaded Teflon sealsD J Auerbach, C A Becker, J P Cowin, et al.
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